Wafer Automatic Optical Inspection Machine
- Line Scan high-speed detection + AI defect classification
- Support for front and back side appearance defect detection of Silicon/Glass Wafer
- Applicable to CIS/IQC/OQC
- Can be equipped with “8/12” EFEM, supports SECS GEM200/300
Computer Vision
Software / Hardware
Features
Use Cases
Vertical Specifics
Business Tags
Semiconductor
Use Cases
Solution Info Link
https://www.favite.com/product/semi-wafer-aoi/
Seller
Wafer Automatic Optical Inspection Machine
Description
- Line Scan high-speed detection + AI defect classification
- Support for front and back side appearance defect detection of Silicon/Glass Wafer
- Applicable to CIS/IQC/OQC
- Can be equipped with “8/12” EFEM, supports SECS GEM200/300
Vertical Specifics
Business Tags
Semiconductor
Use Cases
AI Category
Computer Vision
Data Source
No items found.
Hardware / Software
Software / Hardware
Solution Info Link
https://www.favite.com/product/semi-wafer-aoi/
Features
Use Cases
Seller