Wafer Automatic AI Optical Inspection Machine
- AI real-time defect detection and classification, real-time detection and classification, processing speed can reach more than 50 FPS
- Can be equipped with “8/12” EFEM, supports SECS GEM200/300
- Min defect size ≧ 0.3µm
- Can be equipped with a yield management system
Computer Vision
Software / Hardware
Features
Use Cases
Vertical Specifics
Business Tags
Semiconductor
Use Cases
Solution Info Link
https://www.favite.com/product/semi-wafer-ai-aoi/
Seller
Wafer Automatic AI Optical Inspection Machine
Description
- AI real-time defect detection and classification, real-time detection and classification, processing speed can reach more than 50 FPS
- Can be equipped with “8/12” EFEM, supports SECS GEM200/300
- Min defect size ≧ 0.3µm
- Can be equipped with a yield management system
Vertical Specifics
Business Tags
Semiconductor
Use Cases
AI Category
Computer Vision
Data Source
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Hardware / Software
Software / Hardware
Solution Info Link
https://www.favite.com/product/semi-wafer-ai-aoi/
Features
Use Cases
Seller