Wafer Automatic AI OM/AVI
- High-speed automatic defect photography based on KLARF file for分区/分Die/Defect size/Defect type
- Provides AI real-time defect detection; instant detection and classification, processing speed up to 50 FPS or more
- Can be equipped with “8/12” EFEM, supports SECS GEM200/300
- Defect photography and detection of wafer/packaging process QA inspection stations/CP & FT
Computer Vision
Software / Hardware
Features
Use Cases
Vertical Specifics
Business Tags
Semiconductor
Use Cases
Solution Info Link
https://www.favite.com/product/semi-wafer-ai-om-avi/
Seller
Wafer Automatic AI OM/AVI
Description
- High-speed automatic defect photography based on KLARF file for分区/分Die/Defect size/Defect type
- Provides AI real-time defect detection; instant detection and classification, processing speed up to 50 FPS or more
- Can be equipped with “8/12” EFEM, supports SECS GEM200/300
- Defect photography and detection of wafer/packaging process QA inspection stations/CP & FT
Vertical Specifics
Business Tags
Semiconductor
Use Cases
AI Category
Computer Vision
Data Source
No items found.
Hardware / Software
Software / Hardware
Solution Info Link
https://www.favite.com/product/semi-wafer-ai-om-avi/
Features
Use Cases
Seller