Using SolVision AI image platform's unsupervised learning tool Anomaly Detection, AI deep learning is performed with non-defective image samples (Golden Sample), and data augmentation technology is used to improve the AI model's recognition of standard samples. The trained AI model can identify the differences between the tested object and the standard sample, locate and mark the position of the micro-crack defect inside the packaged chip, and is completely unaffected by the characteristics of the penetrating image.