Probe Mark Inspection and Classification
Cognex Deep Learning tools can help verify the difference between OK and NG probe marks, making probe mark detection easier and faster. The software is trained on a wide variety of images, including images showing correct probe marks and images showing unacceptable probe marks. Unacceptable marks can then be classified as "pressure related" or "off center".
Computer Vision
Software / Hardware
Features
Use Cases
Vertical Specifics
Business Tags
Semiconductor
Use Cases
Solution Info Link
https://www.cognex.com/zh-tw/industries/electronics/semiconductors/inspecting-classifying-probe-marks
Seller
Probe Mark Inspection and Classification
Description
Cognex Deep Learning tools can help verify the difference between OK and NG probe marks, making probe mark detection easier and faster. The software is trained on a wide variety of images, including images showing correct probe marks and images showing unacceptable probe marks. Unacceptable marks can then be classified as "pressure related" or "off center".
Vertical Specifics
Business Tags
Semiconductor
Use Cases
AI Category
Computer Vision
Data Source
No items found.
Hardware / Software
Software / Hardware
Solution Info Link
https://www.cognex.com/zh-tw/industries/electronics/semiconductors/inspecting-classifying-probe-marks
Features
Use Cases
Seller